Automatic probe station UF3000EX-e

Probe installations are used in the production of microelectronics and are intended for automatic positioning and installation of semiconductor wafers in the holder for testing them using testers of parametric and functional control of chips (FT-17HF and FT-17DT manufactured by Sovtest ATE / J750, MicroFLEX and UltraFLEX manufactured by Teradyne / Verigy V93000 from Advantest, etc.). Distinctive features: - High positioning accuracy thanks to 4-axis locking mechanism - Automatic front loading plate system Options: * Additional tape loader for semiconductor wafers * SMIF local clean room conditioning Class 108 * Plate holder with heating up to + 200 ° С * Plate holder with cooling to -60 ° C * Plate holder for high frequency testing * Holders for thin plates (from 80 microns) * Holders for plates in the framework (stretching) * System of automatic change of contact device * Probe stripper * Automatic adjustment to test sites * Automatic adjustment of the height of the needles * Inspection of probe contact traces * Simultaneous contacting with multiple crystals * Ink marking device